Abstract:
This research paper investigated the effect of Zinc nano-particles on cadmium sulphide thin film’s electrical properties as a function their as-deposited thicknesses. Solution technique was used to grow thin films on ordinary microscope substrate slides from aqueous solutions of Zn+2 and Cd+2 with S+2 ions in the presence of TEA. By varying its deposition time only to obtain eleven (11) samples, resistance was measured using a two point probe while its conductivity type was measured using a Gauss meter as a function of their thicknesses. The thin films were found to be n-type semiconductors with a very high valence electron density, a band gap of 2.43 eV, an average transmittance above 79% on in the VIS - NIR region and a resistivity of 9.5×101 – 1.22× 102 Ω-cm. Sheet resistivity increased with an increase in Zn ion concentration.
